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Australian Government: National Measurement InstituteAustralian Government: National Measurement Institute
National Measurement Institute
      

Indicative Project

Advanced translation stage for atomic force microscopy

Background Info

​Nanotechnology relies on our ability to characterise, understand and manipulate matter at the nanometre scale. The atomic force microscope (AFM) is an enabling tool for all of these fundamental tasks.

NMI’s scanning probe microscopy laboratory develops and maintains unique state-of-the-art AFM instrumentation and methodology for measurements of dimensions of nanoscale objects that are traceable to the SI metre. This traceability ensures that measurements are comparable to each other
and give industry and researchers confidence in the accuracy of the results.

The requirements for ultimate accuracy of nanoscale neasurements place very high demands on the performance of AFM instrumentation, and NMI is developing unique solutions to meet these demands, including an ultra-stable metrological scanning probe microscope (mSPM).

Project Description

​Develop a software interface between the AFM and translation stage controllers to provide functionality for both scanning and position measurement utilising the new stage.

Examples of Relevant Sudent Courses

Electrical Engineering, ICT, Mechanical Engineering, Nanotechnology, Physics, Science, Software Engineering

Student Level

3rd Year, Honours, Masters

Duration

3 months to 1 year

Location

Lindfield (NSW)

Section

Nanometrology

Desirable Skills

Mechanical design, programming and software development skills, experience with SolidWorks, LabVIEW, Igor

Contact

Malcolm Lawn

Email Contact

malcolm.lawn@measurement.gov.au

Interested in this project?

Application Form